半岛bd体育手机客户端 说明
一般描述
Atomic number of base material: 40 Zirconium
应用
Advanced precursor for atomic layer deposition of ZrO2thin films. Hafnium and zirconium oxides are leading candidates to replace silicion dioxide as the gate oxide in a variety of semiconductor and energy applications. Excellent properties of HfO2and ZrO2films make them especially attractive for gate oxide replacement and as potential insulating dielectrics for capacitive elements in memory devices such as DRAM.
Precursors Packaged for Depositions Systems
线性分子式 | Zr(CH3C5H4)2CH3OCH3 |
分子量 | 295.53 |
MDL编号 | MFCD16875687 |
PubChem化学物质编号 | 329764163 |
NACRES | NA.23 |
形式 | liquid |
reaction suitability | core: zirconium |
颜色 | colorless |
bp | 110 ℃/0.5 mmHg (lit.) |
密度 | 1.27 g/mL±0.01 g/mL at 25 ℃ (lit.) |
SMILES string | C[C]1[C][C][C][C]1.C[C]2[C][C][C][C]2.C[Zr]OC |
InChI | 1S/2C6H7.CH3O.CH3.Zr/c2*1-6-4-2-3-5-6;1-2;;/h2*2-5H,1H3;1H3;1H3;/q;;-1;;+1 |
InChI key | LFGIFPGCOXPKMG-UHFFFAOYSA-N |
象形图 | |
警示用语: | Warning |
危险声明 | H302 - H315 - H319 |
预防措施声明 | P305 + P351 + P338 |
危险分类 | Acute Tox. 4 Oral - Eye Irrit. 2 - Skin Irrit. 2 |
储存分类代码 | 10 - Combustible liquids not in Storage Class 3 |
WGK | WGK 3 |
闪点(F) | 226.4 °F |
闪点(C) | 108 ℃ |