Dimension Edge Specifications |
X-Y Scan Range |
90μm x 90μm typical, 85μm minimum |
Z Range |
10μm typical in imaging and force ramp modes, 9.5μm minimum |
Vertical Noise Floor |
<50pm RMS in appropriate environment, typical imaging bandwidth (up to 625Hz) |
XY Position Sensor Noise Level (Closed Loop) |
<0.5nm RMS typical imaging bandwidth (up to 625Hz) |
Z Position Sensor Noise Level (Closed Loop) |
<0.2nm RMS typical imaging bandwidth (up to 625Hz) |
Sample/Size/Holder |
150mm vacuum chuck, 15mm thick; Up to 40mm thick with optional frame spacer |
Motorized Positioning Stage (X-Y axis) |
150mm x 150mm inspectable area; Programmable for multi-site measurements |
Microscope Optics |
5-megapixel digital camera; 180μm to 1465μm viewing area; Digital zoom and motorized focus |
Signal Access |
Configurable I/O signal access built into controller; Includes customizable signal routing, digital feedback, and dual digital lock-in |
Single Point Spectroscopy |
Three-axis closed loop control for point-and-shoot positioning and ramping; Spring constant calibration with built-in thermal tune |
Sample Temperature Control |
-35 to +250°C with optional heater/cooler accessory; Includes gas purging capability |
AFM Modes |
|
Standard |
Contact Mode, Lateral Force Microscopy, TappingMode?, PhaseImaging?, LiftMode, Magnetic Force Microscopy, Electric Force Microscopy, Dark Lift, Force Spectroscopy, Nanoindentation, Nanolithography, Adhesion, ScanAsyst |
Optional |
Scanning Tunneling Microscopy, Conductive AFM, Tunneling AFM, Scanning Capacitance Microscopy, Surface Potential Microscopy, Piezoresponse Microscopy, Force Modulation Microscopy, Liquid Imaging, Thermal Analysis, Electrochemical AFM |
Probes |
Visit www.brukerAFMprobes.com to see our ocmprehensive listing of probes, including Bruker-exclusive ScanAsyst probes |
Facility Requirements |
|
Vibration Isolation |
Vibration isolation table or integrated vibration/acoustic isolation enclosure required |
Laser Classification |
Class 2M |
Certification |
CE |